Quanta 200 FEI E-SEM

A scanning electron microscope with a Tungsten electron source.

Fully equipped with detectors for characterizing morphology, chemical composition and crystallographic structure of a variety of samples. Chemical composition characterization includes detection of elements in trace amounts up to a level of ppm using a WDS detector.

The microscope is adapted to work with low-vacuum SEM (LVSEM) and high- vapor-pressure samples (liquids, pastes, gels, etc.)using a built-in Environmental SEM (E-SEM) option.

contact person: Dr. Olga Kleinerman