Characterization of microstructural features plays a key-role in Materials Engineering and Materials science. A myriad of advanced techniques are used at the department, including X-ray diffraction, scanning electron microscopy, transmission electron microscopy, and atomic force microscopy.
In addition to leading characterization infrastructure tools, a significant effort is invested in the development of characterization methods and analysis techniques at the department. This includes software for data analysis, and simulation of diffraction and images.
Faculty directly involved in developing characterization methods include: