Microstructural Characterization

One of the key tasks in Materials Science and Engineering is to correlate the structure-function relations of a material, and thereby to control the structure and microstructure which directly affect the physical properties

Therefore, state-of-the-art characterization techniques are utilized to study material structure and microstructure at various length scales. This plays a major role in solving important problems in the field.

The Department of Materials Science and Engineering offers world-class state-of-the-art characterization facilities which include electron microscopy (link to Mika); high-resolution scanning electron microscopy (HRSEM), a transmission electron microscope (TEM), an aberration-corrected monochromatized high-resolution Titan Themis TEM, as well as one-of-a-kind a Xe plasma focused ion beam (FIB) which is coupled with in-situ micro-Raman and Time-of-Flight Secondary Ion Mass Spectrometry (FIB-ToF-SIMS), X-ray diffraction facilities which include a multi-purpose high-resolution diffractometry system (SmartLab) and a MiniFlex.  Atomic force microscopy facilities available at the Department enable observing and studying surface properties and topography at the sub nano-scale resolution.

Faculty members directly involved in developing novel characterization methods include:

Prof. Wayne D. Kaplan

Prof. Boaz Pokroy

Asst. Prof. Yaron Amouyal

Prof. Yehonadav Bekenstein

Assoc. Prof. Shlomo Berger

Prof. Joshua M. Grolman

Asst. Prof. Noy Cohen

Prof. Maytal Caspary Toroker

Prof. Alejandro Sosnik

Prof. Michael S. Silverstein

Assoc.Prof. Yachin Ivry

Prof. Yair‌ Ein-Eli‌‌‌‌‌

Prof. Gitti Frey

Asst. Prof. Elad Koren

Asst. Prof. Yonatan Calahorra

Asst. Prof. Yoav Kalcheim

Prof. Wayne D. Kaplan

Prof. Eugen Rabkin

Prof. Avner Rothschild