Dr. Shaul Michaelson
19/02/2026
David Wang Auditorium, 3rd Floor, Dalia Maydan Bldg.
13:30
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a powerful surface-sensitive analytical technique capable of providing elemental, isotopic, and molecular information with extremely high sensitivity and spatial resolution. In this lecture, the fundamental principles of ToF-SIMS will be briefly introduced, followed by an overview of the key analytical models that make this technique uniquely suited for modern materials research.
The talk will demonstrate how ToF-SIMS enables two-dimensional chemical imaging, depth profiling of multilayer structures, and full three-dimensional compositional reconstruction with nanometer-scale depth resolution. Emphasis will be placed on the ability of ToF-SIMS to simultaneously detect inorganic and organic species, including light elements such as hydrogen, and to retrospectively analyze complete mass spectra acquired at each pixel.