Prof. Oana Cojocaru-Mirédin
10/02/2026
David Wang Auditorium, 3rd Floor, Dalia Maydan Bldg.
13:30
Atom probe tomography (APT) is a mature technique with more than 55 years of development (or even more than 70 years considering its precursor technology, Field Ion Microscopy). This longstanding development is due to its outstanding capabilities; the investigation of a wide variety of materials in 3D and with near-atomic spatial resolution and part-per-million sensitivity. For materials scientists, this capability unlocks direct insight into nanoscale chemistry and structure that cannot be accessed with conventional microscopy or spectroscopy alone. For example, APT allows investigation of nanoscale features and phenomena with high precision, such as crystallographic defects (dislocations, grain boundaries, etc.), growth and precipitation, interdiffusion, and quantum interfaces to be studied [1,2,3].
Today, APT plays a critical role across diverse material systems. In structural metals and alloys, it resolves strengthening mechanisms, corrosion pathways, and irradiation effects. In semiconductors and quantum materials, it delivers precise compositional profiling of ultrathin layers and dopant distributions. In energy materials—batteries, catalysts, and solar cells—it uncovers degradation processes and solid–solid interface chemistry. Its recent compatibility with laser pulsing has expanded its reach to ceramics, organic–inorganic hybrids, geological samples, and other previously challenging classes of materials.
Hence, this lecture introduces not only important principles of the APT (field evaporation phenomenon and laser-matter interaction) but also illustrates how this technique is reshaping our ability to design materials from the atomic scale up. Whether your work targets structural resilience, electronic functionality, or energy sustainability, APT offers a transformative window into the smallest building blocks of your material.
Bibliography:
[1] B. Gault et al., “Atom probe tomography,” Nat. Rev. Methods Prim. 1 51 (2021)
[2] M. Raghuwanshi et al., “Fingerprints Indicating Superior Properties of Internal Interfaces in Cu (In,Ga)Se2 Thin-Film Solar Cells,” Adv. Mater. 34 2203954 (2022)
[3] O. Cojocaru-Mirédin et al., “Atom Probe Tomography: a Local Probe for Chemical Bonds in Solids,” Adv. Mater. 36 2403046 (2024)