The Department of Materials Science & Engineering is opening at the beginning of each semester practical courses for operating the following equipment:
- EMC – The Electron Microscopy Center
- X-Ray Diffraction Laboratory
- The Laboratory for Physical Measurements
EMC – The Electron Microscopy Center – Practical Courses
- E-SEM Quanta 200 –
An environmental SEM, enabling characterization of non-conducting materials without a conductive coating, and is equipped with EDS (light element) and WDS
- Zeiss Ultra-Plus FEG-SEM –
A Schottky field emmission gun high-resolution SEM (FEG-SEM) which includes a heating stage up to 1050C, an EDS detector with an energy resolution of 127eV and a unique combination of detectors. The microscope is also equipped with a pico-indenter for in-situ mechanical testing and a EBSD detector with an option for TKD (Transmission kikuchi diffraction).
- Tecnai G2 T20 –
A 200KeV (or 120KeV) TEM with a LaB6 electron source and an FEI Supertwin Objective Lens. This microscope is also equipped with BF and DF STEM detectors, an EDS detector, a plate camera, a 1Kx1K multi-scan CCD, and a TV rate CCD.
- Titan Themis 60-300 FEG-S/TEM –
A high resolution FEG S/TEM operating at 60, 200 and 300KeV. This microscope is equipped with a monochromator for sub-eV energy resolution and an objective lens aberration corrector system for sub-A spatial resolution. It is also equipped with a high resolution energy filter (for sub-eV EELS and energy filtered TEM), an EDS detector, a high resolution STEM system (including BF, DF and HAADF detectors), a 4Kx4K CCD.
Anyone interested in learning how to operate these microscopes is invited to fill and submit the online registration form (see link below).
ONLINE COURSE REGISTRATION FORM
X-Ray Diffraction Laboratory- Practical Courses
- Basic course for operating the SmartLab – powder samples, polycrystalline materials, basic data analysis, phase analysis
- Advanced course – XRR, in-plane, pole figure measurements
- Advanced course – in-situ heating
The Rikagu SmartLab 9 kW is a high-resolution X-ray diffraction system, which represents the state of the art in fully automated modular XRD systems. Available working modes: Powder diffraction, thin film analysis, in-plane, rocking curve, pole figure, in-situ heating up to 1100°C, XRR, residual stresses measurement and SAXS.
Anyone interested in learning how to operate the XRD is invited to fill and submit the online registration form (see link below).
The time and place for the next meeting to coordinate course times for the next semester will be announced at the beginning of next semester.
ONLINE COURSE REGISTRATION FORM
The Laboratory for Physical Measurements- Practical Courses
- FTIR – Fourier-transformed infrared spectroscopy: The laboratory is equipped with Equinox 55 (Bruker) FTIR, with the following parameters, Wavelength range: 370-500 cm-1, Resolution: 0.5 cm-1, Working temperature: 80-400K, Types of samples: solid, powder, thin films, liquid, gas, Operation mode: Transmission, Reflection, ATR
- Thermal Gravimetric Analyzer STARe System TGA/DSC 3+ high temperatures (25C-1600C)
- Thermal Gravimetric Analyzer STARe System TGA/DSC 3+ LN temperatures (-150- 700C)
- Porosimetry Micromeritics Flex3
- Porosimetry Micromeritics TriStar
- Porosimetry Micromeritics Accupyc
- Porosimetry Micromeritics AutoPore
Individuals with project requiring intensive use with the above equipment are encouraged to fill and submit the online registration form (see link below).
The time and place for the next meeting to coordinate course times for the next semester will be announced at the beginning of next semester.