Bright field TEM micrograph of a thin sapphire film. Local stresses resulted in bending according to the symmetry of sapphire, and form bend contours in the shape of a Star of David.
Bright field TEM micrograph of the grain morphology in a gold wire.
Bright field TEM micrograph of a SiC-YAG composite.
Dewetting of Ni on Sapphire in the presence of anorthite glass
HRTEM micrograph of twins in B4C.
Intergranular film at a Ni alumina interface in a glass doped Alumina-Ni composite.
Stacking faults in SiC.
Intergraular film at an alumina grain boundary in a glass doped alumina sample.
A Cu particle occluded in an alumina grain in a glass doped Alumina-Cu composite.
HRSEM of Mg doped alumina.
HRTEM micrograph of the edge of (001) SrTiO3 annealed at 950˚C for 2hr in air.
SEM micrograph of the dewetted particles and the reduced SrTiO3.
High resolution scanning electron micrograph of a nickel particle agglomerated on a yttrium stabilized zirconia substrate(top view). The flat faces on the nickel crystal are parallel to low energy surfaces of the metal. The nickel-zirconia interface is a critical part of solid-oxide fuel cells.
High resolution scanning electron micrograph of nickel particles agglomerated on a yttrium stabilized zirconia substrate (tilted view).
HRTEM micrograph of an edge-on GB under negative Cs conditions. The upper grain is in a  zone-axis. Nanometric steps are visible along the boundary.