Dr. Semën Gorfman
Department of Materials Science and Engineering, Tel Aviv University, Israel email@example.com
In this talk we will showcase the power of X-ray crystallography for the characterization of functional materials. More specifically, we will demonstrate how time-resolved and synchrotron X-ray diffraction help understand the mechanisms of those material properties, which accumulate from the multi-length-scale (atomic, mesoscopic and macroscopic) processes. Such properties as e.g. piezoelectricity, pyroelectricity, ferroelectricity and shape-memory are underpinned by the strongly interconnected shifts of atomic positions in a unit cell, variation of lattice parameters, displacement of domain walls and intergranular effects. Synchrotron X-ray diffraction offers unique penetrating and non-destructive tool for their measurement and separation.
We will especially focus on time-resolved synchrotron X-ray diffraction investigations of functional perovskite-based solid solutions (e.g. PbZr1-xTixO3, Na0.5Bi0.5TiO3) under alternating electric field and discuss the origin of enhanced electromechanical coupling in ferroelectrics.
Host: Asst. Prof. Yachin Ivry