Gallery

gallery1

Bright field TEM micrograph of a thin sapphire film. Local stresses resulted in bending according to the symmetry of sapphire, and form bend contours in the shape of a Star of David.

 

 

 

 

 

 

 


 

gallery2

Bright field TEM micrograph of the grain morphology in a gold wire.

 

 

 

 

 

 


 

gallery3

Bright field TEM micrograph of a SiC-YAG composite.

 

 

 

 

 

 

 

 


gallery4

Dewetting of Ni on Sapphire in the presence of anorthite glass

 

 

 

 

 


 

gallery5

HRTEM micrograph of twins in B4C.

 

 

 

 

 

 


 

gallery6

Intergranular film at a Ni alumina interface in a glass doped Alumina-Ni composite.

 

 

 

 

 


 

Created by Digital Micrograph, Gatan Inc.
Created by Digital Micrograph, Gatan Inc.

Stacking faults in SiC.

 

 

 

 

 

 

 


 

gallery8

Intergraular film at an alumina grain boundary in a glass doped alumina sample.

 

 

 

 

 


 

gallery9

A Cu particle occluded in an alumina grain in a glass doped Alumina-Cu composite.

 

 

 

 

 

 

 


gallery10

HRSEM of Mg doped alumina.

 

 

 

 

 


 

gallery11

HRTEM micrograph of the edge of (001) SrTiO3 annealed at 950˚C for 2hr in air.

 

 

 

 

 

 


 

gallery12

SEM micrograph of the dewetted particles and the reduced SrTiO3.

 

 

 

 


 

gallery13

High resolution scanning electron micrograph of a nickel particle agglomerated on a yttrium stabilized zirconia substrate(top view). The flat faces on the nickel crystal are parallel to low energy surfaces of the metal. The nickel-zirconia interface is a critical part of solid-oxide fuel cells.

 

 

 

 


gallery14

High resolution scanning electron micrograph of nickel particles agglomerated on a yttrium stabilized zirconia substrate (tilted view).

 

 

 

 

 


gallery15

HRTEM micrograph of an edge-on GB under negative Cs conditions. The upper grain is in a [001] zone-axis. Nanometric steps are visible along the boundary.