Electron Microscopy Center
The Electron Microscopy Center provides for microstructural and microchemical characterization of materials, and serves scientists at the Technion, Israeli research institutes and Israeli industry. In addition to providing microscopy facilities for research and development, undergraduate and graduate students alike learn to operate and utilize the various equipment for materials characterization.
Undergraduate students use the center within the framework of the Advanced Student Laboratory under the guidance of experienced operators. Graduate students undergo training for independent operation of all the equipment, for use in their research projects.
The Electron Microscopy Center has five areas of focus which include:
- Transmission electron microscopy (TEM) including aberration corrected high resolution transmission electron microscopy (HRTEM)
- Scanning electron microscopy (SEM)
- The application of analytical techniques for chemical analysis in the electron microscope
- Computerized optical microscopy
- Specimen preparation
Transmission electron microscopy includes two instruments. The first is a FEI Titan 80-300 kV S/TEM which was purchased as part of the Russell Berrie Nanotechnology Institute. The Titan is equipped with a monochromator for sub-eV energy resolution (80-300kV), an (image) aberration corrector, a high resolution energy filter for sub-eV EELS and energy filtered TEM, a high resolution STEM system, including HAADF, an EDS system for local chemical analysis and a 2Kx2K slow scan CCD. In-situ HRTEM is routinely conducted using a double-tilt high temperature (1000°C) specimen holder.
The second TEM is a FEI Tecnai G2 T20 200KeV S-Twin TEM/STEM with a LaB6 electron source. This microscope is also equipped with BF and DF STEM detectors, an EDS system, a plate camera, and a 1Kx1K slow scan CCD.
Scanning electron microscopy is conducted on a FEI E-SEM Quanta 200 combined with EDS, WDS and EBSD. The center is currently purchasing a new high resolution SEM (HRSEM) to replace the existing Leo Gemini 982 system (located in the Wolfson Centre for Interface Science).
Optical microscopy includes two excellent metallographic light microscopes, each connected to a CCD camera and a computer for automated image analysis.
Specimen preparation, an extremely important part of any microscopy laboratory, includes a dual-beam focused ion beam (FIB) system (FEI Strata 400s), diamond saws, diamond polishing systems, dimple grinders, ultrasonic cutters, electro-chemical thinning systems, gold and carbon coaters, two ion millers, a precision ion polishing system, a low-voltage ion polishing system, a plasma cleaner and a cryogenic ultramicrotome.